Analog IC Reliability in Nanometer CMOS

Elie Maricau, Georges Gielen

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Springer New York img Link Publisher

Naturwissenschaften, Medizin, Informatik, Technik / Elektronik, Elektrotechnik, Nachrichtentechnik

Beschreibung

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

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Schlagwörter

Reliability in Nanometer CMOS, Transistor Aging Effects on Circuit Reliability, Analog Integrated Circuits, Failure-resilient Analog Circuit Design, Reliability in Analog Integrated Circuits, Analog Circuits and Signal Processing