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Atomic Layer Deposition

Principles, Characteristics, and Nanotechnology Applications

Marja-Leena Kääriäinen, Arthur Sherman, David Cameron, et al.

PDF
188,99

John Wiley & Sons img Link Publisher

Naturwissenschaften, Medizin, Informatik, Technik / Chemie

Beschreibung

Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It covers ALD's application to microelectronics (MEMS) and nanotechnology; many important new and emerging applications; thermal processes for ALD growth of nanometer thick films of semiconductors, oxides, metals and nitrides; and the formation of organic and hybrid materials.

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Schlagwörter

Industrial Engineering / Manufacturing, Nanotechnology, Industrielle Verfahrenstechnik, Dünne Schicht, Thin Films, Surfaces & Interfaces, Spezialthemen Nanotechnologie, Dünne Schichten, Oberflächen u. Grenzflächen, Materialwissenschaften, Nanotechnology Special Topics, Produktion i. d. Industriellen Verfahrenstechnik, Atomlagenabscheidung, Industrial Engineering, Nanotechnologie, Materials Science